Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29
Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29
Fremont, CA (May 21, 2024) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be participating in one-on-one meetings with investors at the 21st Annual Craig-Hallum Institutional Investor Conference taking place Wednesday, May 29, 2024 at the Depot Renaissance Hotel in Minneapolis.
加利福尼亚州弗里蒙特(2024 年 5 月 21 日) — 半导体测试和老化设备的全球供应商Aehr Test Systems(纳斯达克股票代码:AEHR)今天宣布,总裁兼首席执行官盖恩·埃里克森将在21世纪与投资者进行一对一的会晤st 年度Craig-Hallum机构投资者会议将于2024年5月29日星期三在明尼阿波利斯的仓库万丽酒店举行。
"I look forward to discussing our unique wafer level test and burn-in solutions for semiconductor production and the markets they serve with investors and shareholders at the Craig-Hallum conference," said Mr. Erickson. "Aehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure, as well as for new applications such as optical input/output (I/O) and co-packaged optics devices that are on the horizon. The adoption of wafer level test and burn-in of devices is a significant growth driver for Aehr Test."
埃里克森说:“我期待在Craig-Hallum会议上与投资者和股东讨论我们独特的半导体生产及其所服务的市场的晶圆级测试和老化解决方案。”“Aehr Test为提高半导体的质量、可靠性和产量提供完整的生产解决方案,例如用于电动汽车和充电基础设施的碳化硅器件、用于多种功率转换应用的氮化镓器件、用于数据中心和5G基础设施的硅光子学器件,以及即将推出的光学输入/输出(I/O)和共封装光学设备等新应用。采用晶圆级测试和设备老化是Aehr Test的重要增长动力。”
For additional information, or to schedule a meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr's investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.
欲了解更多信息或安排与 Aehr 管理层的会面,请联系您的 Craig-Hallum 代表或 Aehr 的投资者关系公司 MKR 投资者关系公司,地址为 aehr@mkr-group.com。
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. For more information, please visit Aehr Test Systems' website at www.aehr.com.
关于 Aehr 测试系统
Aehr Test Systems总部位于加利福尼亚州弗里蒙特,是测试、老化和稳定晶圆级、单晶芯片和封装零件形式的半导体器件的测试解决方案的领先供应商,已在全球安装了数千个系统。用于多种应用(包括电动汽车、电动汽车充电基础设施、太阳能和风能、计算、数据和电信基础设施以及固态存储器和存储)的半导体的质量、可靠性、安全和安保需求不断提高,这推动了额外的测试需求、容量需求的增加,以及Aehr Test产品和解决方案的新机遇。Aehr 开发并推出了几款创新产品,包括 FOX-P 系列测试和老化系统以及 FOX WaferPak Aligner、FOX WaferPak 接触器、FOX DiePak Carrier 和 FOX DiePak Loader。FOX-XP和FOX-NP系统是全晶圆接触和单晶片/模块测试和老化系统,可以测试、老化和稳定各种设备,例如尖端的碳化硅基和其他功率半导体、用于手机、平板电脑和其他计算设备的二维和三维传感器、存储器半导体、处理器、微控制器、片上系统以及光子学和集成光学设备。FOX-CP系统是用于逻辑、存储器和光子器件的低成本单晶圆紧凑型测试解决方案,也是FOX-P产品系列的最新成员。FOX WaferPak 接触器包含一个独特的全晶圆接触器,能够测试最大300mm的晶圆,使集成电路制造商能够在FOX-P系统上对整个晶圆进行测试、烧入和稳定。FOX DiePak Carrier 允许在 FOX-NP 和 FOX-XP 系统上同时测试、烧录和稳定单个裸芯片和模块,每个 DiePak 最多可并行 1024 台设备,一次最多可测试 9 个 DiePaks。欲了解更多信息,请访问 Aehr 测试系统的网站 www.aehr.com。
Contacts: | |
Aehr Test Systems Chris Siu Chief Financial Officer csiu@aehr.com |
MKR Investor Relations Inc. Todd Kehrli or Jim Byers Analyst/Investor Contact (323) 468-2300 aehr@mkr-group.com |
联系人: | |
Aehr 测试系统 萧国雄 首席财务官 csiu@aehr.com | MKR 投资者关系公司 Todd Kehrli 或 Jim Byers 分析师/投资者联系人 (323) 468-2300 aehr@mkr-group.com |