Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 21
Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 21
FREMONT, CA / ACCESSWIRE / August 19, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will participate in the 5th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on Wednesday, August 21, 2024.
2024年8月19日/ACCESSWIRE/加州弗里蒙特 - 半导体测试和老化设备的全球供应商Aehr Test Systems(纳斯达克:AEHR)今天宣布,将于2024年8月21日星期三参加第5届Needham虚拟半导体和半盖1x1会议。
Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day.
Aehr Test的总裁兼首席执行官Gayn Erickson和首席财务官Chris Siu将在全天内与投资者举行虚拟会议。
"We look forward to discussing with investors and shareholders our unique wafer level test and package part burn-in solutions for semiconductor production and the markets they serve, including our recently closed acquisition of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market," said Mr. Erickson. "Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices as well as AI processors in both wafer level and packaged part device forms. The adoption of wafer level test and packaged parts burn-in of these devices is a significant growth driver for Aehr Test."
“我们期待与投资者和股东讨论我们的独特晶圆级测试和芯片烧录解决方案,这些解决方案用于半导体生产和它们服务的市场,包括我们最近收购的Incal Technology以及新的高功率芯片可靠性/烧录测试解决方案,在快速增长的人工智能(AI)半导体市场内扩大了我们的可寻地址市场,”Erickson先生说:“Aehr Test为提高半导体的质量、可靠性和产量提供了完整的一站式解决方案,例如用于电动汽车及充电基础设施的碳化硅器件,用于多个功率转换应用的氮化镓器件,例如用于数据中心和5G基础设施的硅光子器件和光学输入/输出(I/O)和共封装光学器件,以及晶圆级和芯片级形式的AI处理器。这些器件采用晶圆级测试和芯片级烧录是Aehr Test的重要增长驱动力。”
For additional information, or to schedule a virtual meeting with Aehr management, please contact your Needham representative, or Aehr's investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.
要获取更多信息或安排与Aehr管理层的虚拟会议,请联系您的Needham代表,或联系Aehr的投资者关系公司MKR Investor Relations,电子邮件地址为aehr@mkr-group.com。
About Aehr Test Systems
aehr@mkr-group.com
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at .
Aehr Test Systems总部位于加利福尼亚弗里蒙特,是半导体器件的测试、老化和稳定解决方案的领先提供商,并在全球安装了数千个系统。半导体在多个应用中的品质、可靠性、安全和安全需要,包括电动汽车、电动汽车充电基础设施、太阳能和风能、计算、数据和电信基础设施以及固态存储器和存储器,都正在推动额外的测试要求、增量容量需求和Aehr Test产品和解决方案的新机会。 Aehr开发并推出多个创新产品,包括FOX-PTm系列测试和烧录系统、FOX WaferPakTm Aligner、FOX WaferPak Contactor、FOX DiePak Carrier和FOX DiePak Loader。FOX-XP和FOX-NP系统是全晶圆接触和单个芯片/模块测试和烧录系统,可测试、烧录和稳定各种器件,例如先进的碳化硅和其他功率半导体、移动电话、平板电脑和其他计算设备中使用的2D和3D传感器、存储器半导体、处理器、微控制器、SoC、光电和集成光学器件。 FOX-CP系统是用于逻辑、存储器和光子器件的低成本单晶圆紧凑型测试解决方案,是FOX-P产品系列的最新成员。 FOX WaferPak Contactor包含独特的全晶圆触点器,可测试直径长达300mm的晶圆,使IC制造商能够在FOX-P系统上进行满晶圆的测试、烧录和稳定。 FOX DiePak Carrier允许在FOX-NP和FOX-XP系统上测试、烧录和稳定高达1024个器件的单个芯片和模块,最多可同时使用9个DiePak。Aehr通过收购Incal Technology Inc.获得了新的高功率打包零件可靠性/烧录测试解决方案,用于人工智能(AI)半导体制造商,包括其用于AI加速器、GPU和高性能计算(HPC)处理器的超高功率Sonoma系列测试解决方案,将Aehr定位于快速增长的AI市场,成为从工程到高产量生产的可靠性和测试的一站式提供商。有关更多信息,请访问Aehr Test Systems的网站。
CONTACTS:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
联系方式:
aehr test systems公司
Chris Siu
致富金融(临时代码)
csiu@aehr.com
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
MKR Investor Relations公司
Todd Kehrli或Jim Byers
分析师/投资者联系方式
(323)468-2300
aehr@mkr-group.com
SOURCE: Aehr Test Systems
资料来源:Aehr Test Systems