Cohu, Inc. (NASDAQ:COHU), a global supplier of equipment and services optimizing semiconductor manufacturing yield and productivity, today announced that a leading European customer has selected Cohu's Neon system for high-speed handling and inspection of high-power SiC dies in burn-in test applications. This expands Cohu's products into burn-in and stress-test SiC processes.

Cohu's solution offers a proprietary carrier concept that allows singulated die burn-in and stress-test for up to 150 devices per carrier, enabling high parallel test, and optimizing yield and productivity. The unique interface solution enables high-power test up to 2,500V and heat dissipation capability up to 3,000W. In conjunction with test, Cohu's vision inspection metrology technology provides 6-sided optical inspection with micro-scale defect detection and full traceability from wafer input to output, satisfying stringent automotive zero-defect requirements. The accompanying AI inspection software utilizes proprietary deep learning and neural network-based pattern recognition to improve inspection yield and maximize throughput, reducing customers' total cost of ownership. The silicon carbide power market is projected to be approximately $2.2 billion this year with a CAGR of 25% through 2029 driven mainly by vehicle electrification and renewable energy, representing a $50 million market opportunity for Cohu in this type of equipment.